Materials Characterisation and Electron Microscopy Service (SCM-SME)

The service

One of the Universitat Internacional de Catalunya’s principal objectives since opening its doors in 1997 has been to conduct and promote research. UIC Barcelona has carried out its research and knowledge transfer plan, which has enabled the University to position itself in a competitive environment and in a short time has multiplied the number of competitive projects it is involved in with companies, chairs, research classrooms, agreements and services.

The University has recently acquired two new pieces of equipment: a scanning electron microscope with X-ray microanalysis and a servo-hydraulic mechanical testing machine for characterising the static and cyclic mechanical properties of different materials.

As a result, UIC Barcelona has launched the Materials Characterisation and Electron Microscopy Service (hereinafter, SCM-SEM or SEM) in order to support research, innovation, knowledge transfer and teaching at the University.

 Equipment

The following equipment is currently available at the SCM-SEM:

 

  1. Scanning electron microscope JEOL JSM5410 equipped with X-ray energy microanalysis for the detection of chemical elements.
    This scanning electron microscope JSM-5410 can be used to observe different types of samples including metallic, ceramic and polymeric samples. However, it is possible to study both solid and particulate samples. All operations, including vacuum evacuation, image observation and focusing have been automated. In addition, the acquisition of digitally processed still images makes the JSM-5410 a well-functioning instrument.
    The JSM-5410 has an energy dispersive X-ray detector (EDS) attached to the microscope’s camera. The JSM-5410LV + EDS is a high performance all-purpose electronic scanning microscope that can be used for tasks from morphological observation to elemental composition analysis.
     
  2. Sputtering system to make samples conductiveThe Manual Sputter Coater AGAR B7340 is designed to deposit gold layers on the surface of samples to prevent charging effects when observed under the scanning electron microscope. It uses a planar magnetron sputtering setting to provide an efficient high-speed coating with minimal sample heating.
     
  3. ZwickRoell servo-hydraulic highly-accurate mechanical testing machine for static and cyclic mechanical fatigue tests for material characterisation.
     
  4. Clamps to carry out mechanical testing.

 

Rates

1.  Electron Microscopy Service (SME)

Device

Measure

UIC Barcelona user rate

Electron microscope (JEOL 5410) (secondary and backscattered electrons)

Time

45 €

Preparation of samples by SEM (Sputtering)

Process

15 €

X-ray microanalysis

Session

15 €


2. Mechanical Characterisation Service (SCME)

Device

Measure

UIC Barcelona user rate

Mechanical fatigue testing equipment

Time

40 €

Preparation of samples for testing

Process

Rate may vary depending on model

 

Reserving electron microscope service (sme) and mechanical characterisation (scme)

To reserve the SME, please send an email to José Ángel Delgado: jadelgado@uic.es, head of the service and equipment handling.

Once you have written to Dr José Ángel Delgado, you will be sent a form to be able to plan the SEM session.