One of the main characteristics of the JSM-5410LV scanning electron microscope is high resolution and great depth of field, which allows highly magnified images to be obtained. It can be used to observe different types of samples, including metal, ceramic and polymer samples. Therefore, both solid and particle samples can be studied. All the operations, including venting, image observation and focusing have been automated. Also, the acquisition of fixed image processes digitally ensures that the JSM-5410 is a suitably operational device.
Another characteristic of the JSM-5410 is that is has an Oxford energy dispersive x-ray detector (EDS) attached to the microscope chamber. The JSM-5410LV + EDS is a high performance all-purpose electronic scanning microscope that can extend its utility from morphological observation to elemental composition analysis.
Electron gun with an acceleration voltage of 10 to 30 kV, adjustable in stages.
Source of electrons with K-type tungsten filament, automatic polarisation and electron gun alignment.
Resolution of at least 5nm in image mode of secondary electrons at 30 kV and a working distance of 8 mm.
Range of magnification from x15 to x50 000, depending on the characteristics of the samples.
Images in secondary electron mode and backscattered electrons.
System of lenses with hysteresis removal. Ordinary gauge with manual or automatic adjustment, adjustable from 10-12 to 10-6 A.
Manual and automatic focus with high and low adjustment. Autofocus scan.